MAIT WELCOMES GOVERNMENT’S MOVE TO INTRODUCE PARALLEL TESTING METHODOLOGY FOR ELECTRONIC PRODUCTS
Bringing significant relief to the ICT hardware industry, the Government of India has considered MAIT’s recommendation on ‘parallel testing’ for electronics hardware products. The Bureau of Indian Standards (BIS) has confirmed that it will run a pilot project on the same for mobile phones to start with.
MAIT, India’s apex industry body representing the IT, Telecom, and Electronics hardware sector, had been pursuing the government on the matter since August and had made multiple representations to MeitY and BIS on the issue.
MAIT had contended that by adopting ‘parallel testing’ instead of the presently prevalent ‘sequential testing’ methodology, the industry could save 4 to 13 weeks in the compliance process.
The apex industry body has pitched the idea to BIS & Ministry of Electronics and Information Technology (MeitY).
Speaking on this development, Col. Ali Akhtar Jafri, Retd., Director General, MAIT, said: “It’s a welcome development for the industry. The move will reduce ‘time-to-market’ and the velocity of business will receive a boost. We thank Shri Alkesh Sharma, Secretary MeitY, Shri Rohit Kumar Singh, Secretary MoCA and Shri Pramod Kumar Tiwari, DG BIS for this revolutionary step in the true spirit of enabling Ease of Doing Business. We also hope to see this innovative step being extended to other electronic products.
Notably, BIS is one of the regulatory authorities of Government of India that approves various products based on safety and user-friendliness, among other things. Parallel testing is something where different parts of an electronics products are tested simultaneously, where as in sequential testing methodologies, those parts are tested one by one.